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[ascl:1512.008] Bisous model: Detecting filamentary pattern in point processes

The Bisous model is a marked point process that models multi-dimensional patterns. The Bisous filament finder works directly with galaxy distribution data and the model intrinsically takes into account the connectivity of the filamentary network. The Bisous model generates the visit map (the probability to find a filament at a given point) together with the filament orientation field; these two fields are used to extract filament spines from the data.

Code site:
https://github.com/etempel/Bisous
Bibcode:
2015ascl.soft12008T

Views: 1947

ascl:1512.008
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